This measurement of the frequency of the oscillations of silicon is based on the LASER heterodyning detection technique is based on the principle of optical inteferometry, which is the technique of studying of the interference pattern made due to the superposition of two components with very close frequency difference. The instrument used to interfere the waves together is called an interferometer. Interferometer is an important investigative technique in the field of astronomy, fiber optics, engineering metrology, optical metrology, oceanography, seismology, nuclear and particle physics. .
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