Article : Heterodyne Detection Of Frequency And Its Amplitude Of Oscillations Of A Silicon Wafer

Title

Heterodyne Detection Of Frequency And Its Amplitude Of Oscillations Of A Silicon Wafer

Author

Gyanendra Krishna Pandey, Dinesh Kumar Patel

This measurement of the frequency of the oscillations of silicon is based on the LASER heterodyning detection technique is based on the principle of optical inteferometry, which is the technique of studying of the interference pattern made due to the superposition of two components with very close frequency difference. The instrument used to interfere the waves together is called an interferometer. Interferometer is an important investigative technique in the field of astronomy, fiber optics, engineering metrology, optical metrology, oceanography, seismology, nuclear and particle physics.                                                                 .

Sign-in to continue reading Full Article
 
 

 

Pay only for this article and continue reading the full article

Price

Indian Member   40.00

Others Member   3.00

 

 

 

Content

Submit Article

iJARS Group invites Genuine Research Papers on Modern/Advanced trends in various fields of study.

To submit an article

Click Here

Content

Conferences

Associate your Conference with us Click here

Suggest a New Conference Click here

Upcoming Conferences Click here